首页> 外国专利> SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING IT (SEMICONDUCTOR STRUCTURE WITH FIELD SHIELD AND METHOD OF FORMING THE STRUCTURE)

SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING IT (SEMICONDUCTOR STRUCTURE WITH FIELD SHIELD AND METHOD OF FORMING THE STRUCTURE)

机译:半导体结构及其形成方法(具有场屏蔽的半导体结构及其形成方法)

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor structure that incorporates a field shield below a semiconductor device (e.g., a field effect transistor (FET) or a diode).;SOLUTION: This field shield is sandwiched between upper and lower isolation layers 203, 204 on a wafer. A local interconnect 235 extends through the upper isolation layer 204 and connects the field shield to a selected doped semiconductor region of the device (e.g., a source/drain region 211, 212 of a FET or a cathode or anode of a diode). Current that passes into the device, for example, during back-end of the line charging, is shunted by the local interconnect away from the upper isolation layer 204 and down into the field shield. Consequently, an electric charge 220 is not allowed to build up in the upper isolation layer but rather bleeds from the field shield into the lower isolation layer and into the substrate below. This field shield further provides a protective barrier against any electric charge that becomes trapped within the lower isolation layer or substrate.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供一种在半导体器件(例如,场效应晶体管(FET)或二极管)下方结合了场屏蔽的半导体结构。解决方案:该场屏蔽夹在上下隔离层203之间,在晶片上的204。局部互连235延伸穿过上隔离层204,并将场屏蔽连接到器件的选定掺杂半导体区域(例如,FET的源/漏区域211、212或二极管的阴极或阳极)。例如,在线路充电的后端期间,进入设备的电流被本地互连分流,远离上隔离层204并向下进入场屏蔽。因此,不允许电荷220在上隔离层中累积,而是从场屏蔽泄漏到下隔离层以及下面的衬底中。该场屏蔽层还提供了一个保护屏障,可防止任何电荷进入下隔离层或衬底内。;版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP2008172238A

    专利类型

  • 公开/公告日2008-07-24

    原文格式PDF

  • 申请/专利权人 INTERNATL BUSINESS MACH CORP IBM;

    申请/专利号JP20080001417

  • 发明设计人 CLARK JR WILLIAM F;NOWAK EDWARD J;

    申请日2008-01-08

  • 分类号H01L29/786;H01L29/861;

  • 国家 JP

  • 入库时间 2022-08-21 20:23:46

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