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WAVELENGTH SPECTRUM DETECTION METHOD USING AVALANCHE PHOTODIODE

机译:雪崩光电二极管波长光谱检测方法

摘要

PROBLEM TO BE SOLVED: To propose a wavelength spectrum detection method using an APD capable of realizing a compact, portable device of which installation locations are not limited.;SOLUTION: In the method for detecting the wavelength spectrum of arbitrary light, a multiplication factor detection circuit for detecting the multiplication factor of an avalanche photodiode is used to detect the multiplication factor when light for comparison of which wavelength is known in advance is allowed to enter the avalanche photodiode, the multiplication factor when the arbitrary light is allowed to enter the avalanche photodiode using the multiplication factor detection circuit, and the wavelength spectrum of the arbitrary light based on a numerical formula 1.;COPYRIGHT: (C)2009,JPO&INPIT
机译:要解决的问题:提出一种使用APD的波长光谱检测方法,该方法能够实现安装位置不受限制的紧凑型便携式设备。解决方案:在检测任意光的波长光谱的方法中,倍增因子检测当允许事先知道其波长的比较用光进入雪崩光电二极管时,使用用于检测雪崩光电二极管的倍增系数的电路来检测倍增系数,当允许任意光进入雪崩光电二极管时,该倍增系数用于检测雪崩光电二极管的倍增系数。使用倍增因子检测电路,并根据数值公式1计算任意光的波长谱;版权所有:(C)2009,JPO&INPIT

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