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Semiconductor structure and the method of forming that (through the adhesion of metallic oxide, the nitrogen content field-effect transistor gate stack which includes the threshold variable voltage control layer which was formed)

机译:半导体结构及其形成方法(通过金属氧化物的粘附,包括形成的阈值可变电压控制层的氮含量场效应晶体管栅叠层)

摘要

Topic There are times when the semiconductor structure which includes V t stabilization layer with the gate dielectric and the gate electrode is offered.Solutions As for V t stabilization layer, threshold voltage and flat band voltage of structure it is possible, nitriding metallic oxide or nitrogen is not to include metallic oxide, to be stabilized in set point, V t stabilization layer nitrogen is not the semiconductor baseplate or inside the gate dielectric one side includes nitrogen at least under the conditions for including metallic oxide. In addition, this invention offers also the method of forming this kind of structure. Selective figure Figure 6
机译:<主题>有时会提供包含V t 稳定层以及栅极电介质和栅电极的半导体结构。解决方案对于V t 稳定层,阈值结构的电压和平带电压是可能的,氮化的金属氧化物或氮不包括金属氧化物,要在设定点上稳定,V t 稳定层氮不是半导体基板或内部栅电介质的一侧至少在包括金属氧化物的条件下包括氮。另外,本发明还提供了形成这种结构的方法。<选择图>图6

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