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Being the bright survey instrument which image pickup does

机译:是图像拾取所能做的明亮的测量仪器

摘要

A light-and-shade inspecting apparatus (100) and method therefor, includes an image pick-up device (1) for picking up an image of the object (2) to output an image data, an integrated image calculating portion (6) for dividing the image data outputted from the image pick-up device (1) into a mesh pattern of meshes and then adding together the image data within each of the divided meshes to obtain an integrated image, a differentiated image calculating portion (7) for performing a difference operation between each pair of meshes separated by a predetermined interval from each other with respect to their corresponding two integrated images obtained through the integrated image calculating portion (6), a defect detecting portion (8) for comparing a value obtained through the differentiated image calculating portion (7) with a predetermined value to detect as a defect portion which is partially different in luminance from the other portions on the object, an average value calculating portion (9) for calculating an average value of the integrated image obtained through the integrated image calculating portion (6), and a light-and-shade deciding portion (10) for deciding whether the defect detected by the defect detecting portion (8) includes a light defect or a shade defect based on the average value obtained through the average value calculating portion (9) and values of the integrated images in respective pairs of meshes apart by the predetermined interval from each other which have been subjected to the difference operation. Thus, low contrast defects can be precisely detect by distinguishing light and shade defects from each other and without mistaking a single defect for two separate defects. IMAGE
机译:一种光影检查设备(100)及其方法,包括:用于拾取对象(2)的图像以输出图像数据的图像拾取装置(1);集成图像计算部分(6)。用于将从图像拾取装置(1)输出的图像数据划分为网格的网格图案,然后将每个划分的网格内的图像数据相加在一起,以获得积分图像,差分图像计算部分(7)用于相对于通过积分图像计算部分(6)获得的它们对应的两个积分图像,对彼此隔开预定间隔的每对网格之间执行差分操作,缺陷检测部分(8)用于比较通过网格获得的值。具有预定值的微分图像计算部分(7),以将与物体上的其他部分的亮度部分不同的缺陷部分检测为平均值计算端口i (9)用于计算通过积分图像计算部分(6)获得的积分图像的平均值,以及用于确定是否由缺陷检测部分(8)检测到的缺陷的明暗判定部分(10)。包括基于通过平均值计算部分(9)获得的平均值的光缺陷或阴影缺陷以及已经进行了差分运算的,彼此分开预定间隔的各对网格中的积分图像的值。 。因此,通过将光缺陷和阴影缺陷彼此区分开,并且不会将单个缺陷误认为两个单独的缺陷,可以精确地检测出低对比度缺陷。 <图像>

著录项

  • 公开/公告号JP4165932B2

    专利类型

  • 公开/公告日2008-10-15

    原文格式PDF

  • 申请/专利权人 東芝ソリューション株式会社;

    申请/专利号JP19980205252

  • 发明设计人 藤田 稔;

    申请日1998-07-21

  • 分类号G06T1/00;G01N21/892;H04N7/18;

  • 国家 JP

  • 入库时间 2022-08-21 20:20:59

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