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The production mannered null 1st mother

机译:生产礼貌的第一个母亲

摘要

PROBLEM TO BE SOLVED: To provide a manufacturing method of a liquid crystal display by which a defective ratio of a liquid crystal panels can be reduced when the liquid crystal displays are manufactured by using a liquid crystal dropping method using a large-sized substrate.;SOLUTION: The manufacturing method of the liquid crystal display comprises a previous liquid crystal applying step (S11) for applying a liquid crystal 107 on a plurality of cell forming regions I1 to I26 of a sample substrate 150 on a fixed ejection condition by scanning the plurality of cell forming regions using a liquid drop ejecting head in a prescribed direction, a film thickness measuring step (S12) for respectively measuring film thicknesses of the liquid crystal applied on the plurality of cell forming regions I1 to I26, a liquid crystal ejection condition calculating step (S13) for calculating the ejection condition of the liquid crystal ejected by the liquid drop ejecting head on the plurality of cell forming regions I1 to I26 based on the measured result of the thicknesses, and a liquid crystal applying step (S24) for applying the liquid crystal on a plurality cell forming regions on a first mother substrate 201 by scanning the plurality of cell forming regions using the liquid drop ejecting head in the prescribed scanning direction according to the calculated ejection condition of the liquid crystal.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种液晶显示器的制造方法,当通过使用大尺寸基板的液晶滴下法来制造液晶显示器时,可以减少液晶面板的不良率。解决方案:液晶显示器的制造方法包括先前的液晶施加步骤(S11),该液晶施加步骤用于通过固定扫描条件在固定喷射条件下在样本基板150的多个单元形成区域I1至I26上施加液晶107在预定方向上使用液滴喷射头对单元形成区域进行测量,膜厚测量步骤(S12)用于分别测量施加在多个单元形成区域I1至I26上的液晶的膜厚度,液晶喷射条件计算步骤(S13),用于计算由液滴喷射头在多个单元上喷射的液晶的喷射条件。根据厚度的测量结果确定区域I1至I26,以及液晶施加步骤(S24),该液晶施加步骤(S24)通过利用液晶扫描多个单元形成区域来在第一母基板201上的多个单元形成区域上施加液晶。根据计算出的液晶喷射条件,在规定的扫描方向上向液滴喷射头喷射。版权所有:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP4127204B2

    专利类型

  • 公开/公告日2008-07-30

    原文格式PDF

  • 申请/专利权人 セイコーエプソン株式会社;

    申请/专利号JP20030419652

  • 发明设计人 岩田 裕二;桜田 和昭;

    申请日2003-12-17

  • 分类号G02F1/13;G02F1/1339;G02F1/1341;

  • 国家 JP

  • 入库时间 2022-08-21 20:18:19

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