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High purity Ru powder, sputtering target obtained by sintering the high purity Ru powder, thin film obtained by sputtering the target, and method for producing high purity Ru powder

机译:高纯度Ru粉,通过烧结高纯度Ru粉获得的溅射靶,通过溅射靶获得的薄膜以及高纯度Ru粉的制造方法

摘要

A high purity Ru powder characterized in that each content of alkali metal elements such as Na and K is 10 wtppm or less and Al content is 1 to 50 wtppm, and a Ru raw material having a purity of 3N (99.9%) or less A method for producing the same high-purity Ru powder, characterized by being purified by electrolysis in a solution as an anode. Reduces harmful substances as much as possible, reduces the number of particles during film formation, has a uniform film thickness distribution, and has a purity of 4N (99.99%) or more, and forms an electrode material for semiconductor memory capacitors A high-purity Ru powder for producing a sputtering target, a sputtering target obtained by sintering the high-purity Ru powder, a thin film obtained by sputtering the target, and a method for producing the high-purity Ru powder are provided. .
机译:高纯度Ru粉末,其特征在于,Na和K等碱金属元素的含量分别为10wtppm以下,Al含量为1〜50wtppm,并且Ru原料的纯度为3N(99.9%)以下。相同的高纯度Ru粉末的制造方法,其特征在于,在作为阳极的溶液中通过电解进行精制。尽可能减少有害物质,减少成膜时的颗粒数量,具有均匀的膜厚分布,并且纯度为4N(99.99%)或更高,并形成用于半导体存储电容器的电极材料。高纯度提供了一种用于制造溅射靶的Ru粉,通过烧结该高纯度Ru粉而获得的溅射靶,通过溅射该靶而获得的薄膜以及用于制造该高纯度Ru粉的方法。 。

著录项

  • 公开/公告号JPWO2005083136A1

    专利类型

  • 公开/公告日2008-04-24

    原文格式PDF

  • 申请/专利权人 日鉱金属株式会社;

    申请/专利号JP20060510383

  • 发明设计人 新籐 裕一朗;久野 晃;

    申请日2005-02-02

  • 分类号C22C5/04;B22F1;C25C1/20;C25C5/02;C23C14/34;

  • 国家 JP

  • 入库时间 2022-08-21 20:17:16

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