首页> 外国专利> Bipolar Junction Transistor Having A High Germanium Concentration In A Silicon-Germanium Layer And A Method For Forming The Bipolar Junction Transistor

Bipolar Junction Transistor Having A High Germanium Concentration In A Silicon-Germanium Layer And A Method For Forming The Bipolar Junction Transistor

机译:硅锗层中具有高锗浓度的双极结型晶体管及形成该双极结型晶体管的方法

摘要

A method for forming a germanium-enriched region in a heterojunction bipolar transistor and a heterojunction bipolar transistor comprising a germanium-enriched region. A base having a silicon-germanium portion is formed over a collector. Thermal oxidation of the base causes a germanium-enriched region to form on a surface of the silicon-germanium portion subjected to the thermal oxidation. An emitter is formed overlying the germanium-enriched portion region. The germanium-enriched region imparts advantageous operating properties to the heterojunction bipolar transistor, including improved high-frequency/high-speed operation.
机译:一种在异质结双极型晶体管中形成锗富集区的方法以及包括锗富集区的异质结双极晶体管。具有硅锗部分的基极形成在集电极上方。基底的热氧化导致在经历热氧化的硅锗部分的表面上形成锗富集区域。形成覆盖锗富集部分区域的发射极。富含锗的区域赋予异质结双极晶体管以有利的工作特性,包括改善的高频/高速工作。

著录项

  • 公开/公告号US2008191245A1

    专利类型

  • 公开/公告日2008-08-14

    原文格式PDF

  • 申请/专利权人 MICHELLE D. GRIGLIONE;

    申请/专利号US20050598213

  • 发明设计人 MICHELLE D. GRIGLIONE;

    申请日2005-03-10

  • 分类号H01L29/737;H01L21/331;

  • 国家 US

  • 入库时间 2022-08-21 20:16:51

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