首页> 外国专利> Spherical Aberration Corrected Electrostatic Lens, Input Lens, Electron Spectrometer, Photoemission Electron Microscope And Measuring System

Spherical Aberration Corrected Electrostatic Lens, Input Lens, Electron Spectrometer, Photoemission Electron Microscope And Measuring System

机译:球差校正静电透镜,输入透镜,电子光谱仪,光发射电子显微镜和测量系统

摘要

A mesh (M) having an ellipsoid shape or a shape close to the ellipsoid shape is attached to an electrode (EL1) among electrodes (EL1 to ELn). Voltages of the later-stage electrodes (EL2 to ELn) are appropriately set. With this arrangement, a local negative spherical aberration generated by the mesh (M) is cancelled out with a positive spherical aberration. This optimizes an electric field distribution. As a result, this realizes an electrostatic lens whose acceptance angle is extended to about±60°.
机译:在电极(EL1〜ELn)中的电极(EL1)上安装有椭圆形或接近椭圆形的网格(M)。适当地设置后级电极(EL2至ELn)的电压。通过这种布置,由网格(M)产生的局部负球面像差以正球面像差被抵消。这优化了电场分布。结果,这实现了其接受角扩展到大约±60°的静电透镜。

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