首页> 外国专利> Method for scattered radiation correction in x-ray imaging, and x-ray imaging system for this purpose

Method for scattered radiation correction in x-ray imaging, and x-ray imaging system for this purpose

机译:用于x射线成像中的散射辐射校正的方法以及为此目的的x射线成像系统

摘要

A method is disclosed for scattered radiation correction in X-ray imaging, and an X-ray imaging system is disclosed for carrying out the method. In at least one embodiment of the method, measurement signals t from an X-ray detector are digitized and converted to logarithmic form, with these measurement signals t having been obtained by radiation through an examination object by the X-ray detector. Correction values which have been obtained from a series development of a logarithm 1n(1−s/t) are subtracted from the measurement signals that have been converted to logarithmic form, with this series development being terminated at the earliest after the first order, where s denotes a previously determined scattered radiation signal from radiation passed through the examination object. At least one embodiment of the method and the associated X-ray imaging system allow scattered radiation to be corrected for with increased accuracy, on the basis of measurement signals that had been converted to logarithmic form.
机译:公开了一种用于X射线成像中的散射辐射校正的方法,并且公开了一种用于执行该方法的X射线成像系统。在该方法的至少一个实施方式中,来自X射线探测器的测量信号t被数字化并且被转换成对数形式,其中这些测量信号t是通过X射线探测器通过检查对象的辐射而获得的。从对数1n(1-s / t)的级数展开获得的校正值从已转换为对数形式的测量信号中减去,该级数展开最早在一阶之后终止,其中s表示从通过检查对象的放射线中预先确定的散射放射线信号。该方法和相关联的X射线成像系统的至少一个实施例允许基于已经转换成对数形式的测量信号以提高的准确性来校正散射辐射。

著录项

  • 公开/公告号US2008232546A1

    专利类型

  • 公开/公告日2008-09-25

    原文格式PDF

  • 申请/专利权人 KARL STIERSTORFER;

    申请/专利号US20070896213

  • 发明设计人 KARL STIERSTORFER;

    申请日2007-08-30

  • 分类号G01N23/20;

  • 国家 US

  • 入库时间 2022-08-21 20:15:06

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