首页> 外国专利> Method for scattered radiation correction in X-ray imaging, and X-ray imaging system for this purpose

Method for scattered radiation correction in X-ray imaging, and X-ray imaging system for this purpose

机译:用于x射线成像中的散射辐射校正的方法以及用于该目的的x射线成像系统

摘要

The present invention relates to a method for scattered radiation correction in X-ray imaging, and to an X-ray imaging system for carrying out the method. In the method, measurement signals t from an X-ray detector (9) are digitized and converted to logarithmic form, with these measurement signals t having been obtained by radiation through an examination object (10) by the X-ray detector (9). Correction values which have been obtained from a series development of a logarithm ln(1−s/t) are subtracted from the measurement signals that have been converted to logarithmic form, with this series development being terminated at the earliest after the first order, where s denotes a previously determined scattered radiation signal from radiation passed through the examination object (10). The method and the associated X-ray imaging system allow scattered radiation to be corrected for with increased accuracy, on the basis of measurement signals that had been converted to logarithmic form.
机译:X射线成像中的散射辐射校正方法和X射线成像系统技术领域本发明涉及用于X射线成像中的散射辐射校正的方法,以及用于执行该方法的X射线成像系统。在该方法中,来自X射线检测器( 9 )的测量信号t被数字化并转换为对数形式,这些测量信号t是通过检查对象的辐射获得的( 10 )通过X射线检测器( 9 )。从对数ln(1-s / t)的序列展开中获得的校正值从已转换为对数形式的测量信号中减去,该序列展开最早在一阶之后终止,其中s表示从通过检查对象( 10 )的辐射中预先确定的散射辐射信号。该方法和相关的X射线成像系统允许基于已经转换为对数形式的测量信号以提高的准确性来校正散射辐射。

著录项

  • 公开/公告号US7623618B2

    专利类型

  • 公开/公告日2009-11-24

    原文格式PDF

  • 申请/专利权人 KARL STIERSTORFER;

    申请/专利号US20070896213

  • 发明设计人 KARL STIERSTORFER;

    申请日2007-08-30

  • 分类号A61B6/00;

  • 国家 US

  • 入库时间 2022-08-21 18:48:07

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