首页> 外国专利> METHOD OF RECORDING TEMPORARY DEFECT LIST ON WRITE-ONCE RECORDING MEDIUM, METHOD OF REPRODUCING THE TEMPORARY DEFECT LIST, RECORDING AND/OR REPRODUCING APPARATUS, AND THE WRITE-ONCE RECORDING MEDIUM

METHOD OF RECORDING TEMPORARY DEFECT LIST ON WRITE-ONCE RECORDING MEDIUM, METHOD OF REPRODUCING THE TEMPORARY DEFECT LIST, RECORDING AND/OR REPRODUCING APPARATUS, AND THE WRITE-ONCE RECORDING MEDIUM

机译:在一次写入的记录介质上记录临时缺陷清单的方法,一次产生的缺陷列表,记录和/或再现设备的方法以及一次写入的记录介质

摘要

A method of recording a temporary defect list on a write-once recording medium, a method of reproducing the temporary defect list, an apparatus for recording and/or reproducing the temporary defect list, and the write-once recording medium. The method of recording a temporary defect list for defect management on a write-once recording medium includes recording the temporary defect list, which is created while data is recorded on the write-once recording medium, in at least one cluster of the write-once recording medium, and verifying if a defect is generated in the at least one cluster. Then, the method includes re-recording data originally recorded in a defective cluster in another cluster, and recording pointer information, which indicates a location of the at least one cluster where the temporary defect list is recorded, on the write-once recording medium.
机译:在一次写入记录介质上记录临时缺陷列表的方法,再现临时缺陷列表的方法,用于记录和/或再现临时缺陷列表的设备以及一次写入记录介质。在一次写入记录介质上记录用于缺陷管理的临时缺陷列表的方法包括在一次写入的至少一个簇中记录临时缺陷列表,该临时缺陷列表是在将数据记录在一次写入记录介质上时创建的。记录介质,并验证在至少一个簇中是否产生了缺陷。然后,该方法包括在一次写入记录介质上重新记录最初记录在另一个簇中的缺陷簇中的数据,以及记录指示至少一个簇中记录有临时缺陷列表的位置的指针信息。

著录项

  • 公开/公告号US2008094967A1

    专利类型

  • 公开/公告日2008-04-24

    原文格式PDF

  • 申请/专利权人 SUNG-HEE HWANG;JUNG-WAN KO;

    申请/专利号US20070963056

  • 发明设计人 SUNG-HEE HWANG;JUNG-WAN KO;

    申请日2007-12-21

  • 分类号G11B19/02;

  • 国家 US

  • 入库时间 2022-08-21 20:14:49

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