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Methods for analysis of measurement errors in measured signals

机译:分析测量信号中测量误差的方法

摘要

The present invention provides methods for analyzing measurement errors in measured signals obtained in an experiment, e.g., measured intensity signals obtained in a microarray gene expression experiment. In particular, the invention provides a method for transforming measured signals into a domain in which the measurement errors in the transformed signals are normalized by errors as determined from an error model. The methods of the invention are particularly useful for analyzing measurement errors in signals in which at least portion of the error is dependent on the magnitudes of the signals. Such transformed signals permit analysis of data using traditional statistical methods, e.g., ANOVA and regression analysis. Magnitude-independent errors can also be used for comparing level of measurement errors in signals of different magnitudes.
机译:本发明提供了用于分析在实验中获得的测量信号中的测量误差的方法,例如在微阵列基因表达实验中获得的测量强度信号。特别地,本发明提供了一种用于将测量的信号转换到域中的方法,在该域中,通过从误差模型确定的误差来对转换后的信号中的测量误差进行归一化。本发明的方法对于分析信号中的测量误差特别有用,其中误差的至少一部分取决于信号的幅度。这样的变换后的信号允许使用传统的统计方法例如ANOVA和回归分析来分析数据。与幅度无关的误差也可以用于比较不同幅度信号中测量误差的水平。

著录项

  • 公开/公告号US7418351B2

    专利类型

  • 公开/公告日2008-08-26

    原文格式PDF

  • 申请/专利权人 LEE WENG;

    申请/专利号US20030354664

  • 发明设计人 LEE WENG;

    申请日2003-01-30

  • 分类号G06F19/00;

  • 国家 US

  • 入库时间 2022-08-21 20:11:16

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