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CMOS image sensor including photodiodes having different depth according to wavelength of light

机译:CMOS图像传感器包括根据光的波长具有不同深度的光电二极管

摘要

An image sensor capable of preventing the cross-talk phenomenon due to a deep penetration depth and a low absorption coefficient of red light in a photodiode region and a method for fabricating the same, wherein the photodiode for collecting incident light has different depths in accordance with the wavelength of the incident light. The photodiode for receiving red light, which has the longest wavelength, has the deepest depth, the photodiode for receiving blue light has the least depth, and the photodiode for receiving green light, which has a wavelength between the red light and the blue light has an intermediate depth.
机译:能够防止由于光电二极管区域中的红光的较深的穿透深度和低的吸收系数而引起的串扰现象的图像传感器及其制造方法,其中,用于收集入射光的光电二极管具有不同的深度。入射光的波长。接收波长最长的红光的光电二极管的深度最深,接收蓝光的光电二极管的深度最小,而接收绿光的光电二极管的波长在红光和蓝光之间。中间深度。

著录项

  • 公开/公告号US7345703B2

    专利类型

  • 公开/公告日2008-03-18

    原文格式PDF

  • 申请/专利权人 WON-HO LEE;

    申请/专利号US20020330138

  • 发明设计人 WON-HO LEE;

    申请日2002-12-30

  • 分类号H04N3/14;H04N5/335;H04N9/04;H04N9/083;H01L31/06;H01L21/00;

  • 国家 US

  • 入库时间 2022-08-21 20:11:01

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