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Process of making a III-V compound semiconductor heterostructure MOSFET

机译:制造III-V化合物半导体异质结构MOSFET的工艺

摘要

A method of forming a compound semiconductor device comprises forming a gate insulator layer overlying a compound semiconductor substrate, defining an active device region within the compound semiconductor substrate, forming ohmic contacts to the compound semiconductor substrate proximate opposite sides of the active device region, and forming a gate metal contact electrode on the gate insulator layer in a region between the ohmic contacts. The ohmic contacts having portions thereof that overlap with portions of the gate insulator layer within the active device region. The overlapping portions ensure an avoidance of an undesirable gap formation between an edge of the ohmic contact and a corresponding edge of the gate insulator layer.
机译:形成化合物半导体器件的方法包括:形成覆盖化合物半导体衬底的栅极绝缘体层;在化合物半导体衬底内限定有源器件区域;在有源器件区域的相对侧附近形成与化合物半导体衬底的欧姆接触;以及形成在欧姆接触之间的区域中的栅极绝缘体层上的栅极金属接触电极。欧姆接触的部分与有源器件区域内的栅极绝缘层的部分重叠。重叠部分确保避免在欧姆接触的边缘与栅极绝缘层的相应边缘之间形成不希望的间隙。

著录项

  • 公开/公告号US7429506B2

    专利类型

  • 公开/公告日2008-09-30

    原文格式PDF

  • 申请/专利权人 MATTHIAS PASSLACK;

    申请/专利号US20050236186

  • 发明设计人 MATTHIAS PASSLACK;

    申请日2005-09-27

  • 分类号H01L29/20;

  • 国家 US

  • 入库时间 2022-08-21 20:10:49

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