首页> 外国专利> Method for measuring hysteresis curve and anisotropic energy of magnetic memory unit

Method for measuring hysteresis curve and anisotropic energy of magnetic memory unit

机译:磁存储单元的磁滞曲线和各向异性能的测量方法

摘要

A method for measuring hysteresis curves and anisotropic energy of magnetic memory units is disclosed. It comprises gradually applying different magnetic fields to a single-layer or a multilayer magnetic structure (such as a MRAM memory unit) by extra ordinary Hall effect, and recording the variation of the Hall voltage to obtain the hysteresis curve and anisotropic energy with specific instruments, and calculating the individual anisotropic energy value of the magnetic material of the single-layer or the multilayer magnetic structure.
机译:公开了一种用于测量磁存储单元的磁滞曲线和各向异性能的方法。它包括通过特殊的霍尔效应将不同的磁场逐渐施加到单层或多层磁性结构(例如MRAM存储单元)上,并记录霍尔电压的变化,以使用特定仪器获得磁滞曲线和各向异性能量,并计算单层或多层磁性结构的磁性材料的各个各向异性能值。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号