首页> 外国专利> Write margin of SRAM cells improved by controlling power supply voltages to the inverters via corresponding bit lines

Write margin of SRAM cells improved by controlling power supply voltages to the inverters via corresponding bit lines

机译:通过通过相应的位线控制反相器的电源电压,可以改善SRAM单元的写裕度

摘要

Each memory cell has a pair of inverters whose inputs and outputs are connected to each other and holds complementary data respectively in storage nodes which are outputs of the inverters. In a write operation during which the complementary data are written to the storage nodes respectively, the power control circuit sets a power supply voltage of the inverter having the storage node to which low level is written lower than a power supply voltage of the inverter having the storage node to which high level is written. Since power supply capability to the inverter having the storage node to which the low level is written lowers, the voltage of the storage node easily changes to the low level. That is, a write margin of a memory cell can be improved.
机译:每个存储单元具有一对反相器,它们的输入和输出彼此连接,并且在作为反相器的输出的存储节点中分别保存互补数据。在将补充数据分别写入到存储节点的写入操作中,电源控制电路将具有写入了低电平的存储节点的逆变器的电源电压设定为低于具有存储节点的逆变器的电源电压。写入高级别的存储节点。由于具有写入了低电平的存储节点的逆变器的电源供给能力降低,因此存储节点的电压容易变为低电平。即,可以提高存储单元的写裕度。

著录项

  • 公开/公告号US7447058B2

    专利类型

  • 公开/公告日2008-11-04

    原文格式PDF

  • 申请/专利权人 YASUHIKO MAKI;KOJI SHIMOSAKO;

    申请/专利号US20060341429

  • 发明设计人 KOJI SHIMOSAKO;YASUHIKO MAKI;

    申请日2006-01-30

  • 分类号G11C11/00;

  • 国家 US

  • 入库时间 2022-08-21 20:10:20

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