Fault list and test pattern generating apparatus and method, fault list generating and fault coverage calculating apparatus and method

摘要

The test pattern generating apparatus contains a module configured to generate short information indicative of a relationship between a logical value of an input signal of a cell and a voltage of an electrically shorted portion assumed at an output terminal of the cell; a module configured to calculate a logical threshold value of the input terminal of the cell so as to generate logical threshold value information; a module configured to extract a bridge fault information from layout information of an LSI; a module configured to generate a bridge fault list including a bridge fault type based on the bridge fault information, the short information, and the logical threshold value information; and a module configured to generate a test pattern which detects bridge faults in an adjacent signal wire pair and a bridge fault type.