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Plasma processing method, detecting method of completion of seasoning, plasma processing apparatus and storage medium

机译:等离子处理方法,调味完成的检测方法,等离子处理设备和存储介质

摘要

With analysis data in the prior art, it is difficult to find out if a change regarded as a judgmental standard of the completion of seasoning has come from a change due to the seasoning, namely, change in condition of the interior of a processing container or come from another change based on a temperature change among respective dummy wafers and furthermore, it is difficult to judge whether the seasoning has been completed or not. Therefore, a plasma processing method of the present invention, which is a method for detecting the completion of seasoning in performing the seasoning by loading dummy wafers W into a processing container 2 of a plasma processing apparatus 1, includes a process of creating a predictive formula for predicting the completion of seasoning and another process of detecting the completion of seasoning in performing the seasoning, based on the predictive formula. The creation of the predictive formula is accomplished by performing a multivariate analysis against a plurality of measured data that can be obtained by first supplying dummy wafers W into the processing container 2, cooling down the interior of the processing container 2 and supplying a plurality of dummy wafers W into the processing container 2 again.
机译:利用现有技术中的分析数据,难以发现被视为调味完成的判断标准的改变是否来自调味引起的改变,即,处理容器内部或容器内部的状态改变。由于来自各个伪晶片之间的温度变化的另一变化,并且难以判断调味是否已完成。因此,本发明的等离子处理方法是在通过将虚设晶片W装载到等离子处理装置的处理容器 2 中进行调味的过程中,检测调味完成的方法。参照图1,包括创建用于预测调味完成的预测公式的过程以及基于该预测公式检测执行调味过程中的调味完成的另一过程。通过对多个测量数据进行多元分析来完成预测公式的创建,这些测量数据可以通过以下步骤获得:首先将虚拟晶片W放入处理容器 2 中,然后冷却处理容器的内部 2 ,并向处理容器 2 中再次供应多个伪晶片W。

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