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Design techniques for low leakage circuits based on delay statistics

机译:基于延迟统计的低泄漏电路设计技术

摘要

A low-leakage circuit design method involves determining a capacity of a power gating transistor using delay statistics, wherein the resulting power gating transistor has sufficient capacity to supply all of the current necessary to meet the demands of the powered design elements while minimizing an amount of chip space required to implement the power gating transistor. The capacity of the power gating transistor is determined by first estimating a capacity necessary to meet the demands of all design elements connected to the transistor. The design elements are then grouped according to input signal arrival time to determine an amount by which the estimated capacity of the gating transistor may be reduced without affecting operation of the design elements. Various grouping schemes are evaluated to determine an optimal grouping. The estimated transistor capacity is reduced according to the optimal grouping, and the power gating transistor is implemented accordingly.
机译:一种低泄漏电路设计方法,包括使用延迟统计信息确定功率门控晶体管的容量,其中所得的功率门控晶体管具有足够的容量,可提供满足上电设计元件需求所需的所有电流,同时最大程度地减少所需的电流。实现功率门控晶体管所需的芯片空间。通过首先估计满足连接到晶体管的所有设计元件的需求所必需的电容来确定功率门控晶体管的电容。然后,根据输入信号的到达时间将设计元素分组,以确定一个数量,在不影响设计元素的操作的情况下,可以减小门控晶体管的估计电容。评估各种分组方案以确定最佳分组。根据最佳分组减少了估计的晶体管容量,并且相应地实现了功率门控晶体管。

著录项

  • 公开/公告号US7370294B1

    专利类型

  • 公开/公告日2008-05-06

    原文格式PDF

  • 申请/专利权人 ARIFUR RAHMAN;

    申请/专利号US20050111652

  • 发明设计人 ARIFUR RAHMAN;

    申请日2005-04-21

  • 分类号G06F17/50;

  • 国家 US

  • 入库时间 2022-08-21 20:09:07

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