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Decision selection and associated learning for computing all solutions in automatic test pattern generation (ATPG) and satisfiability
Decision selection and associated learning for computing all solutions in automatic test pattern generation (ATPG) and satisfiability
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机译:决策选择和相关学习,用于计算自动测试模式生成(ATPG)和可满足性中的所有解决方案
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摘要
An all solutions automatic test pattern generation (ATPG) engine method uses a decision selection heuristic that makes use of the “connectivity of gates” in the circuit in order to obtain a compact solution-set. The “symmetry in search-states” is analyzed using a “Success-Driven Learning” technique which is extended to prune conflict sub-spaces. A metric is used to determine the use of learnt information a priori, which information is stored and used efficiently during “success driven learning”.
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