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PHASE-CHANGE FILM FOR SEMICONDUCTOR NON-VOLATILE MEMORY AND SPUTTERING TARGET FOR FORMING SUCH PHASE-CHANGE FILM

机译:半导体非挥发记忆体的相变膜和形成这种相变膜的溅射靶

摘要

ABSTRACT PHASE-CHANGE FILM FOR SEMICONDUCTOR NON-VOLATILE MEMORY AND SPUTTERING TARGET FOR FORMING SUCH PHASE-CHANGE FILM There are provided a phase change film for a semiconductor nonvolatile memory and a sputtering target for forming the phase change film. The phase change film for a semiconductor nonvolatile memory and the sputtering target for forming the phase change film have a composition containing 10 to 25 atomic% of Ge, 10 to 25 atomic% of Sb, 1 to 10 atomic% of Ga, and 10 atomic % or less of B, A1, C, Si and lanthanoid elements, with the balance being Te and inevitable impurities.No Figure for publication
机译:抽象半导体非易失性存储器的相变膜和形成相变膜的溅射靶材 提供了一种用于半导体的相变膜非易失性存储器和溅射靶,用于形成相变膜。相变膜半导体非易失性存储器和溅射靶用于形成相变膜的成分含有10至25原子%的Ge,10至25原子%的Sb,1至10原子%的Ga,以及10原子%或更少的B,A1,C,Si和镧系元素,其余为Te和不可避免的杂质。没有数字可发布

著录项

  • 公开/公告号SG146642A1

    专利类型

  • 公开/公告日2008-10-30

    原文格式PDF

  • 申请/专利权人 MITSUBISHI MATERIALS CORPORATION;

    申请/专利号SG20080068637

  • 发明设计人 KINOSHITA KEI;NONAKA SOHEI;MORI SATORU;

    申请日2004-09-08

  • 分类号C01G30/00;C23C14/14;C23C14/34;H01L27/105;H01L45/00;

  • 国家 SG

  • 入库时间 2022-08-21 20:05:33

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