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BASAL PLATE DEFORMATION DETECTING SYSTEM AND DEFORMATION DETECTING METHOD

机译:基底板变形检测系统及变形检测方法

摘要

The subject matter is related to a deformation detecting system for inspecting and detecting deformations of a basal plate with front and rear flat surfaces that are in parallel with each other in a non-deformed state. The system is provided with supporting members (122A-122C) to support a basal plate (W) in a substantially horizontal standard position and first and second optical sensors. The first sensors (161) define a first optical path (L1) passing immediately over the front surface of the basal plate in the case that the basal plate is in a non-deformed state and is supported by the supporting members. The second sensors (162) define a second optical path (L2) passing immediately under the rear surface of the basal plate in the case that the basal plate is in a non-deformed state and is supported by the supporting members. The first and second sensors detect cutoffs of the first and second optical paths due to the subject basal plate supported by the supporting members, respectively. The system is provided with a deformation judging means (143) for judging deformations of the basal plate whether or not such deformations are larger in magnitude than the standard degree of deformations in accordance with detecting information of the optical sensors (161, 162).
机译:本主题涉及一种变形检测系统,该变形检测系统用于检查和检测基板的变形,该基板的前平坦表面和后平坦表面在未变形状态下彼此平行。该系统设置有用于将基板(W)支撑在基本水平的标准位置的支撑构件(122A-122C)以及第一和第二光学传感器。在基板处于未变形状态并且由支撑构件支撑的情况下,第一传感器(161)限定在基板的前表面上方直接通过的第一光路(L1)。在基板处于未变形状态并且由支撑构件支撑的情况下,第二传感器(162)限定第二光路(L2),第二光路(L2)在基板的后表面的正下方通过。第一和第二传感器分别检测由于被支撑构件支撑的受检基底板而引起的第一和第二光路的截止。该系统设置有变形判断装置(143),用于根据光学传感器(161、162)的检测信息判断基板的变形的大小是否大于标准变形程度。

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