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BASAL PLATE DEFORMATION DETECTING MECHANISM, PROCESSING SYSTEM, BASAL PLATE DEFORMATION DETECTION METHOD AND RECORDING MEDIUM

机译:基底板变形检测机理,处理系统,基底板变形检测方法及记录介质

摘要

PROBLEM TO BE SOLVED: To prevent a basal plate from being broken by detecting deformations such as warpage of the basal plate before processing the basal plate.;SOLUTION: A mechanism 123 which detects deformations of the basal plate W is equipped with supporting members 122A, 122B and 122C which support the basal plate W, a light projection section 141 which projects light, and a light reception section 142 which receives the light projected by the projection section 141. The light projected by the projection section 141 is made to pass through a first optical path L1 extending above a position where the upper surface of the basal plate W supported by the supporting members 122A, 122B and 122C should be positioned when the basal plate W is normal, and to pass through a second optical path L2 extending below a position where the under surface of the basal plate W should be positioned.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:为了在处理基板之前通过检测诸如基板的翘曲之类的变形来防止基板破裂。解决方案:检测基板W的变形的机构123配备有支撑构件122A,支撑基板W的部件122B和122C,投射光的光投射部141和接收由投射部141投射的光的光接收部142。使由投射部141投射的光通过当基板W正常时,第一光路L1延伸到由支撑构件122A,122B和122C支撑的基板W的上表面应当定位的位置上方,并穿过在光路下方延伸的第二光路L2。版权所有:(C)2009,日本特许厅&INPIT

著录项

  • 公开/公告号JP2009200063A

    专利类型

  • 公开/公告日2009-09-03

    原文格式PDF

  • 申请/专利权人 TOKYO ELECTRON LTD;

    申请/专利号JP20060141377

  • 发明设计人 MORI KOHEI;KUME JUNJI;

    申请日2006-05-22

  • 分类号H01L21/66;H01L21/306;H01L21/304;

  • 国家 JP

  • 入库时间 2022-08-21 19:44:57

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