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INTEGRATED CIRCUIT DEVICE, METHOD FOR CONTROLLING OPERATION OF INTEGRATED CIRCUIT DEVICE, AND METHOD FOR MANUFACTURING INTEGRATED CIRCUIT DEVICE
INTEGRATED CIRCUIT DEVICE, METHOD FOR CONTROLLING OPERATION OF INTEGRATED CIRCUIT DEVICE, AND METHOD FOR MANUFACTURING INTEGRATED CIRCUIT DEVICE
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机译:集成电路装置,用于控制集成电路装置的操作的方法以及制造集成电路装置的方法
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摘要
An integrated circuit device comprises a start time operation circuit (101) performing processing required for starting, and an after start operation circuit (102) performing normal operation after ending the processing required for starting. The lower limit value of operation guarantee temperature of the after start operation circuit (102) is set higher than the lower limit value of operation guarantee temperature of the start time operation circuit (101). The after start operation circuit (102) starts normal operation when the temperature of the integrated circuit device exceeds a threshold temperature which is the lower limit value of operation guarantee temperature of the after start operation circuit (102).
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