SCAN-BASED TESTING OF DEVICES IMPLEMENTING A TEST CLOCK CONTROL STRUCTURE(TCCS)

摘要

A scan-based testing method forming a TCCS(Test Clock Control Structure) is provided to reduce an amount of scan load and unload sequences and the test time by transmitting control information to a programmable test clock controller independently of the transmission of scan data, by using a control chain different from a scan chain. A method for forming a TCCS(701) performing scan-based testing of plural circuits(750) is composed of a step for training a first sub set of domains of plural circuits forming dynamic fault detection test patterns by performing a test in the domain and a step for training a second sub set of domains of plural circuits forming dynamic fault detection test patterns by performing a test between the domains. The dynamic fault detection test patterns include LSL(Last-Shift-Launch) test patterns and broadside test patterns.