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Scan-based testing of devices implementing a test clock control structure ('TCCS')
Scan-based testing of devices implementing a test clock control structure ('TCCS')
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机译:对实现测试时钟控制结构(TCCS)的设备进行基于扫描的测试
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摘要
Methods and computer readable media for performing scan-based testing of circuits using one or more test clock control structures are disclosed. In one embodiment, a method includes performing an intra-domain test to exercise a first subset of domains of the plurality of circuits implementing dynamic fault detection test patterns. It also includes performing an inter-domain test to exercise a second subset of domains of the plurality of circuits implementing dynamic fault detection test patterns. The dynamic fault detection test patterns can include, for example, last-shift-launch test patterns and broadside test patterns. In various embodiments, the method can include configuring different programmable test clock controllers to test different domains substantially in parallel.
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