首页> 外国专利> HIGH ETCH RESISTANT HARDMASK COMPOSITION HAVING ANTIREFLECTIVE PROPERTY WITH IMPROVEMENT OF CARBON CONTENTS AND PROCESS OF PRODUCING PATTERNED MATERIALS BY USING THE SAME

HIGH ETCH RESISTANT HARDMASK COMPOSITION HAVING ANTIREFLECTIVE PROPERTY WITH IMPROVEMENT OF CARBON CONTENTS AND PROCESS OF PRODUCING PATTERNED MATERIALS BY USING THE SAME

机译:具有相同抗反射性能的高抗蚀刻硬质橡胶组合物,同时改善了碳含量,并使用相同的方法生产图案材料

摘要

A copolymer containing an aromatic ring, an antireflective hard mask composition containing the copolymer, and a method for preparing a material shape patterned on a substrate by using the composition are provided to minimize the reflection between a resist and a back layer and to improve etching selectivity. A copolymer containing any one aromatic ring represented by the formula 1, 2 or 3, wherein 1=m=750; 1=n=750; R1 is -CH2-, -CH2-Ph-CH2-, -CH2-Ph-Ph-CH2- or -CH(-OH-substituted Ph)- or -CH(-Ph)-; R2 is -O- or -CnH2nO- of C1-C7; and R3 to R7 are independently H, a hydroxyl group, a C1-C10 alkyl group, a C6-C10 aryl group, an allyl group or a halogen atom. An antireflective hard mask composition comprises the copolymer containing an aromatic ring; an initiator; and an organic solvent.
机译:提供一种包含芳环的共聚物,一种包含该共聚物的抗反射硬掩模组​​合物以及通过使用该组合物制备在基板上图案化的材料形状的方法,以使抗蚀剂和背层之间的反射最小化并改善蚀刻选择性。 。含有式1、2或3表示的任意1个芳香族环的共聚物,其中1≤m≤750。 1 <= n <= 750; R1是-CH2-,-CH2-Ph-CH2-,-CH2-Ph-Ph-CH2-或-CH(-OH-取代的Ph)-或-CH(-Ph)-; R2是C1-C7的-O-或-CnH2nO-; R 3至R 7独立地为H,羟基,C 1 -C 10烷基,C 6 -C 10芳基,烯丙基或卤素原子。一种抗反射硬掩模组​​合物,包括含有芳环的共聚物;和发起人;和有机溶剂。

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