首页> 外国专利> 2-Transistor NOR-type non-volatile memory cell array and Method for processing 2-Transistor NOR-type non-volatile memory data.

2-Transistor NOR-type non-volatile memory cell array and Method for processing 2-Transistor NOR-type non-volatile memory data.

机译:2-晶体管NOR型非易失性存储单元阵列和处理2-晶体管NOR型非易失性存储数据的方法。

摘要

2T having the select transistor and the floating gate or the charge accumulation charge accumulation storage transistor having an insulator a NOR cell array, and 2T NOR flash memory cells, a data processing method that is used to read or erase the stored data, or to store data in the 2T NOR cell array is disclosed. The 2T NOR cell array is provided with a selection transistor and the storage transistor. The selection transistor is connected to a terminal is applied to the bit line selection signal to the gate terminal. The storage transistor is a terminal connected to the other terminal of the selection transistor and the other terminal connected to a common source line, and the control voltage applied to the gate. Is applied to the select transistor and the bulk (Bulk) area, back bias (Back Bias) is the program voltage of the storage transistor, and a floating gate or the charge accumulation insulator between the gate and the bulk region of the storage transistor.
机译:具有选择晶体管和浮栅的2T或具有绝缘体NOR单元阵列和2T NOR闪存单元的电荷累积电荷累积存储晶体管,用于读取或擦除所存储的数据或用于存储的数据处理方法公开了2T NOR单元阵列中的数据。 2T NOR单元阵列设置有选择晶体管和存储晶体管。选择晶体管连接到端子,该端子施加到位线选择信号到栅极端子。存储晶体管是连接到选择晶体管的另一个端子和连接到公共源极线的另一个端子,并且控制电压施加到栅极。施加到选择晶体管和体(Bulk)区域,背偏置(Back Bias)是存储晶体管的编程电压,并且浮置栅极或栅极和存储晶体管的体区域之间的电荷累积绝缘体。

著录项

  • 公开/公告号KR100861749B1

    专利类型

  • 公开/公告日2008-10-09

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20060132823

  • 发明设计人 최웅림;

    申请日2006-12-22

  • 分类号G11C16/02;G11C16/30;G11C16/10;

  • 国家 KR

  • 入库时间 2022-08-21 19:51:34

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