ARCHITECTURE OF BIULT-IN SELF TEST OF STORING DEVICE HAVING DISTRIBUTED COMMAND INTERPRETATION AND GENERIC COMMAND PROTOCOL

摘要

FIELD: physics, computing science.;SUBSTANCE: architecture of built-in self test (BIST) has distributed interpretation of algorithms and includes three stages of abstraction: centralized controller of built-in self test (BIST), pointer set of sequence and set of interfaces of the storing device. The controller of built-in self test (BIST) saves command sets, which determine algorithm for testing of the storing device's units irrelatively to physical characteristics or distribution requirements of the units of the storing device through time. Sequencers interpreter the commands according to the protocol of commands and generate sequence of operations of the storing device.;EFFECT: guarantee of possibility to test many distributed units of storing device having various distribution requirements through time and various physical characteristics.;38 cl, 14 dwg, 2 tbl