首页> 外国专利> Memory architecture with integrated self-test (BIST) having distributed command interpretation and generalized command protocol.

Memory architecture with integrated self-test (BIST) having distributed command interpretation and generalized command protocol.

机译:具有集成自测(BIST)的内存体系结构,具有分布式命令解释和通用命令协议。

摘要

A system comprising: a built centralized controller self-test (BIST) that (4) stores a adapted to check a plurality of modules (12, 12A) memory algorithm, characterized in that the plurality of modules (12, 12A ) memory with timing requirements and physical characteristics different in the BIST (4) controller stores the algorithm as a set of generalized commands that conform a command protocol; and a plurality of sequencers distributed (8, 8A), adapted to receive said commands from the BIST controller (4), that interpret the commands based on the command protocol, and apply the generalized modules (12, 12A) commands memory, where each sequencer is associated with one or more modules (12, 12A) and memory in which at least two of the sequencers are associated with memory modules having timing requirements and physical characteristics different.
机译:一种系统,包括:内置的集中控制器自检(BIST),其(4)存储适于检查多个模块(12、12A)的存储算法,其特征在于,所述多个模块(12、12A)具有定时的存储器BIST(4)控制器中的要求和物理特性不同,将算法存储为一组符合命令协议的通用命令;分布式的多个定序器(8、8A),适于从BIST控制器(4)接收所述命令,它们基于命令协议解释命令,并应用通用模块(12、12A)命令存储器,其中每个定序器与一个或多个模块(12、12A)和存储器相关联,其中至少两个定序器与时序要求和物理特性不同的存储器模块相关联。

著录项

  • 公开/公告号ES2329797T3

    专利类型

  • 公开/公告日2009-12-01

    原文格式PDF

  • 申请/专利权人 QUALCOMM INCORPORATED;

    申请/专利号ES20040757984T

  • 发明设计人 AVERBUJ ROBERTO F.;HANSQUINE DAVID W.;

    申请日2004-03-19

  • 分类号G11C29;G11C29/16;

  • 国家 ES

  • 入库时间 2022-08-21 18:43:18

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