首页> 外国专利> Radiation inspection apparatus e.g. positron computerized tomography apparatus, measures time at which peak values of detection signal is equivalent to two threshold values, based on which incidence time of signal is calculated

Radiation inspection apparatus e.g. positron computerized tomography apparatus, measures time at which peak values of detection signal is equivalent to two threshold values, based on which incidence time of signal is calculated

机译:放射线检查装置正电子计算机断层摄影设备,根据检测到的信号入射时间,测量检测信号的峰值等于两个阈值的时间

摘要

A semiconductor detection unit (11) detects gamma ray discharged from positron nuclear species in target object (S) of patient, and measures time at which peak values of detection signal is equivalent to two different threshold values. The incidence time of the detection signal is calculated by primary regression based on the measured times, and detection data is output to an information processing unit (14) which regenerates image data based on the detection data. An independent claim is also included for radiation detection circuit.
机译:半导体检测单元(11)检测从患者的目标物体(S)中的正电子核素释放的伽马射线,并测量检测信号的峰值等于两个不同阈值的时间。基于所测量的时间通过一次回归来计算检测信号的入射时间,并且将检测数据输出至信息处理单元(14),该信息处理单元基于该检测数据来再生图像数据。辐射检测电路也包括独立权利要求。

著录项

  • 公开/公告号FR2905767A1

    专利类型

  • 公开/公告日2008-03-14

    原文格式PDF

  • 申请/专利权人 SUMITOMO HEAVY INDUSTRIES LTD;

    申请/专利号FR20060053666

  • 发明设计人 AOKI KENICHI;

    申请日2006-09-11

  • 分类号G01T1/24;A61B6/03;G01T1/161;

  • 国家 FR

  • 入库时间 2022-08-21 19:47:08

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