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METHOD FOR MANUFACTURING SOI SUBSTRATE COMBINING SILICON BASED ZONES AND GaAs ZONES

机译:基于硅的地带和GaAs地带相结合的SOI基体制造方法

摘要

The invention relates to a method for manufacturing an SOI substrate combining silicon-based zones and GaAs-based material zones in the thin film of the SOI substrate, the SOI substrate comprising a silicon support that successively supports a layer of silicon. dielectric material and a thin layer of silicon. The method comprises the following steps: providing an SOI substrate comprising a disoriented silicon support at an angle of between 2 degrees and 10 degrees, the thin silicon layer being oriented parallel to the plane (001) or (010) ), or (100) or (110) or (101) or (011) or (111), - preservation of at least one zone of the thin layer of silicon, - elimination of at least one unsprung area of the thin layer of silicon to reveal the layer of dielectric material, - opening, in said non-preserved area, of the layer of dielectric material to reveal the silicon support, - growth, from the support silicon revealed by said liquid phase epitaxial or lateral epitaxial opening of disoriented germanium on the layer of dielectric material revealed; - growth of GaAs-based material from the disoriented germanium obtained in the previous step.
机译:本发明涉及一种用于在SOI衬底的薄膜中结合基于硅的区域和基于GaAs的材料区域的SOI衬底的制造方法,该SOI衬底包括依次支撑硅层的硅支撑体。电介质材料和硅薄层。该方法包括以下步骤:提供SOI衬底,该SOI衬底包括以2度至10度之间的角度取向的硅支撑体,该薄硅层平行于(001)或(010)或(100)平面取向。或(110)或(101)或(011)或(111),-保留硅薄层的至少一个区域,-消除硅薄层的至少一个未悬挂的区域以露出硅层。介电材料,-在介电材料层的所述非保留区域中开口以露出硅支撑物,-从介电层上由取向的锗的液相外延或横向外延开口所揭示的支撑硅中生长出来的硅资料泄露; -从上一步中获得的取向锗中生长GaAs基材料。

著录项

  • 公开/公告号FR2910700A1

    专利类型

  • 公开/公告日2008-06-27

    原文格式PDF

  • 申请/专利权人 COMMISSARIAT A LENERGIE ATOMIQUE;

    申请/专利号FR20060055825

  • 发明设计人 LAURENT CLAVELIER;CHRYSTEL DEGUET;

    申请日2006-12-21

  • 分类号H01L21/20;H01L21/762;H01L21/8258;

  • 国家 FR

  • 入库时间 2022-08-21 19:47:03

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