首页> 外国专利> MICROSCOPE, IMAGE BLURRING CORRECTION IMAGING LENS FOR MICROSCOPE, AND IMAGE BLURRING CORRECTION METHOD FOR MICROSCOPE

MICROSCOPE, IMAGE BLURRING CORRECTION IMAGING LENS FOR MICROSCOPE, AND IMAGE BLURRING CORRECTION METHOD FOR MICROSCOPE

机译:显微镜,用于显微镜的图像模糊校正成像透镜和用于显微镜的图像模糊校正方法

摘要

PROBLEM TO BE SOLVED: To provide a microscope capable of correcting image blurring caused by the vibration of the microscope, and observing a specimen image without causing any image blurring, to provide an image blurring correction imaging lens used for the microscope, and to provide an image blurring correction method for the microscope.;SOLUTION: The microscope 1 includes: a stage 14; an imaging lens 18 disposed between an objective lens 17 and each of image faces I1 and I2; a driving device that moves the imaging lens within a plane perpendicular to the optical axis of the imaging lens; at least one displacement detection sensor S1 that detects an amount of displacement between the objective lens and stage within the plane orthogonal to the optical axis of the imaging lens; and a control device 22 that moves the imaging lens by the drive of the driving device based on a signal detected by the displacement detection sensor, thereby correcting image blurring on each image face.;COPYRIGHT: (C)2009,JPO&INPIT
机译:要解决的问题:提供一种能够校正由显微镜的振动引起的图像模糊并且在不引起任何图像模糊的情况下观察标本图像的显微镜,提供一种用于显微镜的图像模糊校正成像镜头,并提供一种显微镜的图像模糊校正方法。解决方案:显微镜1包括:载物台14;以及载物台14。成像透镜18设置在物镜17与像面I1和I2中的每一个之间;驱动装置,其在与摄像透镜的光轴垂直的平面内使摄像透镜移动。至少一个位移检测传感器S1,其检测在与成像透镜的光轴正交的平面内的物镜与镜台之间的位移量;控制装置22,其通过驱动装置的驱动,基于由位移检测传感器检测到的信号,使摄像镜头移动,从而校正各像面上的图像模糊。;版权所有:(C)2009,JPO&INPIT

著录项

  • 公开/公告号JP2009180828A

    专利类型

  • 公开/公告日2009-08-13

    原文格式PDF

  • 申请/专利权人 NIKON CORP;

    申请/专利号JP20080018132

  • 发明设计人 IKO CHIKAYA;

    申请日2008-01-29

  • 分类号G02B21/00;G02B21/08;G02B21/26;G02B21/02;

  • 国家 JP

  • 入库时间 2022-08-21 19:46:12

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