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TEST QUALITY EVALUATION DEVICE OF SEMICONDUCTOR INTEGRATED CIRCUIT, AND TEST QUALITY EVALUATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT
TEST QUALITY EVALUATION DEVICE OF SEMICONDUCTOR INTEGRATED CIRCUIT, AND TEST QUALITY EVALUATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT
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机译:半导体集成电路的测试质量评估装置以及半导体集成电路的测试质量评估方法
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摘要
PROBLEM TO BE SOLVED: To provide a test quality evaluation device of a semiconductor integrated circuit for achieving improvement of test quality.;SOLUTION: The test quality evaluation device 100 of the semiconductor integrated circuit includes: a failure-layout information link part for preparing a weighing failure dictionary by allowing a layout element relating to non-detection failure to correspond to the non-detection failure not detected by a test pattern as weighing of the non-detection failure; a test quality index calculating part for outputting an obtained product as an inferiority remaining rate due to the test pattern by multiplying weighing of the non-detection failure, an inferior mode-failure model corresponding factor, and an inferiority generation rate of a layout element unit; a determining part for determining whether the inferiority remaining rate is a target value or less; and a test point insertion part for inserting a test point for preferentially detecting the non-detection failure of large weighing in a logic net of a test object circuit based on the weighing failure dictionary when the inferiority remaining rate is determined to be higher than the target value with the determination part.;COPYRIGHT: (C)2009,JPO&INPIT
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