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Evaluation of machine learning classifiers in faulty die prediction to maximize cost scrapping avoidance and assembly test capacity savings in semiconductor integrated circuit (IC) manufacturing

机译：故障模具预测机器学习分类器的评估最大化成本克服避税和装配测试能力节省在半导体集成电路（IC）制造中的节省

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Azlan Faizal Mohd Fazil; Izwan Nizal Mohd Shaharanee; Jastini Mohd Jamil;
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年度 2019
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3. Cycle-Time Key Factor Identification and Prediction in Semiconductor Manufacturing Using Machine Learning and Data Mining [J] . Meidan Y., Lerner B., Rabinowitz G., Semiconductor Manufacturing, IEEE Transactions on . 2011,第2期

机译：使用机器学习和数据挖掘的半导体制造中的周期时间关键因素识别和预测
4. Evaluation of machine learning classifiers in faulty die prediction to maximize cost scrapping avoidance and assembly test capacity savings in semiconductor integrated circuit (IC) manufacturing [C] . Azlan Faizal Mohd Fazil, Izwan Nizal Mohd Shaharanee, Jastini Mohd Jamil Innovation and Analytics Conference amp;amp;amp; Exhibition . 2019

机译：故障模具预测机器学习分类器的评估最大化成本克服避税和装配测试能力节省在半导体集成电路（IC）制造中的节省
5. Integrated Optimization of Semiconductor Manufacturing: A Machine Learning Approach. [D] . Kupp, Nathan. 2012

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6. Prediction of immune checkpoint inhibition with immune oncology-related gene expression in gastrointestinal cancer using a machine learning classifier [O] . Zhihao Lu, Huan Chen, Xi Jiao, 2020

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7. Cycle-Time Key Factor Identification and Prediction in Semiconductor Manufacturing Using Machine Learning and Data Mining [O] . Yair Meidan, Boaz Lerner, Gad Rabinowitz, 2011

机译：使用机器学习和数据挖掘半导体制造中的周期时间关键因子识别与预测

Evaluation of machine learning classifiers in faulty die prediction to maximize cost scrapping avoidance and assembly test capacity savings in semiconductor integrated circuit (IC) manufacturing

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