首页> 外国专利> EVALUATION METHOD OF HYDROPHOBIC PROPERTY, HMDS PROCESSING SUBSTRATE, EVALUATION SYSTEM OF HYDROPHOBIC PROPERTY, SEMICONDUCTOR DEVICE, AND ELECTRONIC APPARATUS

EVALUATION METHOD OF HYDROPHOBIC PROPERTY, HMDS PROCESSING SUBSTRATE, EVALUATION SYSTEM OF HYDROPHOBIC PROPERTY, SEMICONDUCTOR DEVICE, AND ELECTRONIC APPARATUS

机译:疏水性的评估方法,HMDS处理基质,疏水性的评估系统,半导体器件和电子设备

摘要

PROBLEM TO BE SOLVED: To solve a problem, in the case of obtaining hydrophobic property of a substrate surface using HMDS, that if PDMS (polydimethylsiloxane) exits as a contaminant, a large amount of ions of masses 73 ((CH3)3Si+) and 89 ((CH3)3SiO-) is generated by such PDMS and this PDMS is used as a separator of various injection mold type plastics and therefore exists in a winder range, but such amount of ions is insufficient as a monitor signal showing the state of hydrophobic property at the surface of substrate and such monitor signal results in a large error as the signal reflecting the state of hydrophobic property.;SOLUTION: In the evaluation method of hydrophobic property, amount of PDMS is measured, influence on the hydrophobic group element and influence on hydrophilic group element because of contamination by PDMS measured previously are subtracted from such measured amount of PDMS and thereafter a value obtained by dividing a signal of the hydrophobic group element with a signal of the hydrophilic group is used as an evaluation index to evaluate the hydrophobic property. Since hydrophobic property is obtained by compensating for an error with contamination by PDMS, high precision evaluation index for hydrophobic property can be calculated.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:为了解决问题,在使用HMDS获得基板表面的疏水性的情况下,如果PDMS(聚二甲基硅氧烷)作为污染物排出,则大量的质量离子73((CH 3 3 Si + )和89((CH 3 3 SiO - )是由此类PDMS生成的,并且此PDMS用作各种注塑模具类型塑料的分隔物,因此存在于卷绕器范围内,但这种离子量不足以作为监视信号,表明在此处的疏水性状态基材的表面和此类监测信号会导致较大的误差,因为该信号反映了疏水性状态。解决方案:在疏水性评估方法中,测量了PDMS的含量,对疏水基团元素的影响以及对亲水性的影响。从PDMS的这种测量量中减去由于先前测量的PDMS污染引起的组元素,然后将值ob通过将疏水性基团元素的信号除以亲水性基团的信号所得到的Rb作为评价指标来评价疏水性。由于可通过补偿PDMS的污染误差获得疏水性,因此可以计算出疏水性的高精度评估指数。; COPYRIGHT:(C)2009,JPO&INPIT

著录项

  • 公开/公告号JP2009054915A

    专利类型

  • 公开/公告日2009-03-12

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20070222227

  • 发明设计人 WADA MITSUHIRO;

    申请日2007-08-29

  • 分类号H01L21/027;

  • 国家 JP

  • 入库时间 2022-08-21 19:45:18

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