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METHOD AND DEVICE FOR ADJUSTING POSITION OF OPTICAL SYSTEM TO BE INSPECTED IN SPOT CHARACTERISTIC MEASUREMENT
METHOD AND DEVICE FOR ADJUSTING POSITION OF OPTICAL SYSTEM TO BE INSPECTED IN SPOT CHARACTERISTIC MEASUREMENT
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机译:调整点特征测量中被检光学系统位置的方法和装置
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摘要
PROBLEM TO BE SOLVED: To automate and perform highly accurately in a short time, position adjustment of an optical system to be inspected when performing spot characteristic measurement.;SOLUTION: The position of the optical system to be inspected to a measuring device is moved successively, and an image of a light beam is imaged in each movement, and a brightness integrated value of the whole image and brightness integrated values classified by each domain in the image are determined. A first determination processing for determining whether the determined brightness integrated value of the whole image becomes higher than a first threshold or not, and a second determination processing for comparing each largeness of the brightness integrated values classified by each domain, and determining whether a difference between the maximum brightness integrated value and the minimum brightness integrated value becomes higher than a second threshold or not, are performed, and a first movement processing based on a scattered light pattern and the second movement processing based on the brightness integrated value are performed corresponding to the determination result.;COPYRIGHT: (C)2009,JPO&INPIT
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