首页> 外国专利> NANOPARTICLE COMPONENT MEASURING DEVICE AND ABNORMALITY DETERMINING METHOD AND CALIBRATION METHOD OF NANOPARTICLE COMPONENT MEASURING DEVICE

NANOPARTICLE COMPONENT MEASURING DEVICE AND ABNORMALITY DETERMINING METHOD AND CALIBRATION METHOD OF NANOPARTICLE COMPONENT MEASURING DEVICE

机译:纳米粒子成分测定装置及纳米粒子成分测定装置的异常测定方法及校正方法

摘要

PROBLEM TO BE SOLVED: To provide a nanoparticle component measuring device for accurately measuring a nanoparticle composition with high sensitivity.;SOLUTION: The nanoparticle component measuring device for measuring nanoparticles in an exhaust gas which is a measurement gas 11 includes an electrostatic classifier 12 for classifying a nanoparticle component in the measurement gas 11, a mass spectrometer 16 measuring the component of the classified nanoparticles and having a laser device 17, and a first inner standard gas supply part for supplying a first inner standard gas 14-1 into the measurement gas introduced into the electrostatic classifier 12.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种用于以高灵敏度准确地测量纳米粒子组成的纳米粒子成分测量装置;解决方案:用于测量作为测量气体的废气中的纳米粒子的纳米粒子成分测量装置11包括用于分类的静电分类器12。测量气体中的纳米粒子成分11,测量已分类的纳米粒子的成分的质谱仪16,具有激光装置17以及用于将第一内部标准气体14-1供给到导入的测量气体中的第一内部标准气体供给部。进入静电分级机12 .;版权:(C)2010,JPO&INPIT

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