首页> 外国专利> DESIGN PROGRAM FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, DESIGN SUPPORT SYSTEM FOR THE SAME, DESIGN METHOD FOR THE SAME, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, AND ELECTRONIC APPARATUS

DESIGN PROGRAM FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, DESIGN SUPPORT SYSTEM FOR THE SAME, DESIGN METHOD FOR THE SAME, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, AND ELECTRONIC APPARATUS

机译:半导体集成电路装置的设计程序,相同的设计支持系统,相同的设计方法,半导体集成的电路装置和电子设备

摘要

PROBLEM TO BE SOLVED: To provide a design support program, etc., for a semiconductor integrated circuit device for suppressing increase of a chip size or working man-hour by detecting and correcting only a real transition time error in accordance with the operation frequency of each cell.;SOLUTION: The design support program makes a computer function as a transition time calculating means 12, a transition time standard value setting means 14, and a transition time error detecting means 16. The transition time calculating means 12 calculates the transition time of an input signal of each cell, on the basis of a net list including connection information of the plurality of cells. The transition time standard value setting means 14 sets the standard value of the transition time of the input signal in each cell, on the basis of correspondence relation which is previously defined about the operation frequency and the standard value of the transition time. The transition time error detecting means 16 detects the error of the transition time by each cell, on the basis of the transition time calculated by the transition time calculating means 12 and the standard value set by the transition time standard value setting means 14.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种用于半导体集成电路器件的设计支持程序等,以通过仅根据其工作频率检测和校正实际的过渡时间误差来抑制芯片尺寸或工作工时的增加。 SOLUTION:设计支持程序使计算机具有转换时间计算装置12,转换时间标准值设置装置14和转换时间误差检测装置16。转换时间计算装置12计算转换时间。基于包括多个小区的连接信息的网表,确定每个小区的输入信号。过渡时间标准值设置装置14基于预先定义的关于操作频率和过渡时间的标准值的对应关系,来设置每个单元中的输入信号的过渡时间的标准值。过渡时间误差检测装置16基于由过渡时间计算装置12计算出的过渡时间和由过渡时间标准值设定装置14设定的标准值,检测每个单元的过渡时间的误差。 :(C)2009,日本特许厅&INPIT

著录项

  • 公开/公告号JP2009070325A

    专利类型

  • 公开/公告日2009-04-02

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20070240864

  • 发明设计人 KOBAYASHI SHIGEMI;TORII KENSUKE;

    申请日2007-09-18

  • 分类号G06F17/50;H01L21/82;H01L21/822;H01L27/04;

  • 国家 JP

  • 入库时间 2022-08-21 19:43:09

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号