首页> 外国专利> METHOD FOR MANUFACTURING COLLOID PROBE CANTILEVER FOR ATOMIC FORCE MICROSCOPE AND ITS MANUFACTURING DEVICE

METHOD FOR MANUFACTURING COLLOID PROBE CANTILEVER FOR ATOMIC FORCE MICROSCOPE AND ITS MANUFACTURING DEVICE

机译:原子力显微镜中胶体探针的制造方法及其制造装置

摘要

PROBLEM TO BE SOLVED: To provide a method of manufacturing a colloid probe cantilever using an optical measurement method and its automated device.;SOLUTION: This method for manufacturing the colloid probe cantilever for an atomic force microscope and its device include: (A) a step of bringing a probe of the cantilever into contact with an adhesive agent and a fluorescent material existing on a substrate surface; and (B) a step of measuring a change in the intensity of fluorescence from fluorescent molecules to relatively position an end of the probe and colloid particles existing on the substrate surface, and bringing the colloid particles into contact with the end of the probe.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种使用光学测量方法制造胶体探针悬臂的方法及其自动化装置。解决方案:这种用于原子力显微镜的胶体探针悬臂的制造方法及其装置包括:(A)使悬臂的探针与存在于基板表面上的粘合剂和荧光材料接触的步骤; (B)测定来自荧光分子的荧光强度的变化,以使探针的末端和存在于基板表面上的胶体粒子相对定位,并使胶体粒子与探针的末端接触。版权所有:(C)2009,日本特许厅&INPIT

著录项

  • 公开/公告号JP2009115533A

    专利类型

  • 公开/公告日2009-05-28

    原文格式PDF

  • 申请/专利权人 OKAJIMA KOJI;

    申请/专利号JP20070287126

  • 发明设计人 OKAJIMA KOJI;TOKUMOTO HIROSHI;

    申请日2007-11-05

  • 分类号G01N13/16;G01N13/10;

  • 国家 JP

  • 入库时间 2022-08-21 19:42:46

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