首页> 外国专利> Gas analysis manner of the entire organic carbon in the gas which uses the low temperature plasma and the gas which

Gas analysis manner of the entire organic carbon in the gas which uses the low temperature plasma and the gas which

机译:使用低温等离子体的气体和使用低温等离子体的气体中整个有机碳的气体分析方式

摘要

PROBLEM TO BE SOLVED: To provide a method and device for performing measurements at normal temperatures when measuring total organic carbon substances included in analysis gas.;SOLUTION: According to this gas analysis method, in an oxygen atmosphere, gas including organic carbon is low-temperature plasma-treated in a system where a metal-carrying catalyst exists, thereby measuring the total organic carbon amount in the gas. This device for gas analysis includes a means for supplying the gas including organic carbon to a reactor; a means for supplying oxygen to the reactor; a low-temperature plasma reactor filled with the metal-carrying catalyst; a high voltage power supply for impressing a voltage on the reactor; a measuring instrument for CO2; and a means for discharging gas produced by decomposition/treatment at the plasma reactor. Since low-temperature plasma and the catalyst are jointly used to oxidize organic carbon at normal temperatures/normal pressures according to these method and device, these method and device are simple, neither requiring a heat-resistant structure for the device nor requiring preheat for a catalyst layer.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种在测量分析气体中所含的总有机碳物质时在常温下进行测量的方法和装置。解决方案:根据这种气体分析方法,在氧气气氛中,包含有机碳的气体含量较低,在存在载金属催化剂的系统中进行等离子处理的高温,从而测量气体中的总有机碳量。该气体分析装置包括用于将包含有机碳的气体供给至反应器的装置。向反应器供氧的装置;填充有载金属催化剂的低温等离子体反应器;用于在电抗器上施加电压的高压电源; CO 2 的测量仪器;在等离子体反应器中排放通过分解/处理产生的气体的装置。由于根据这些方法和装置,低温等离子体和催化剂共同用于在常温/常压下氧化有机碳,因此这些方法和装置很简单,既不需要装置的耐热结构,也不需要预热。催化剂层。;版权所有(C)2005,JPO&NCIPI

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号