首页> 外国专利> The semiconductor device which uses the semiconductor thin film equipped substrate and its semiconductor thin film equipped substrate which are produced making use of the formation manner and its manner of the semiconductor thin film.

The semiconductor device which uses the semiconductor thin film equipped substrate and its semiconductor thin film equipped substrate which are produced making use of the formation manner and its manner of the semiconductor thin film.

机译:使用了利用半导体薄膜的形成方式及其方式制造的带有半导体薄膜的基板及其半导体薄膜基板的半导体装置。

摘要

PROBLEM TO BE SOLVED: To provide a method for improving the characteristics of a device where the surface largely affects electrical and optical characteristics by changing polarity on the surface of a 3-5 or 2-6 group semiconductor such as GaN and ZnO from a conventional anion surface to a more smooth and inactive cation surface.;SOLUTION: A film in the thickness of about several monolayers of metal such a Al is formed inside a 3-5 group or 2-6 group semiconductor film which is epitaxially grown on a sapphire substrate. The polarity on the surface of semiconductor is changed from negative (anion) to positive (cation) at the upper and lower parts of the film. The positive polarity is formed in the epitaxial growth thin film and a polycrystalline thin film of preferred orientation property.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:提供一种方法,用于通过改变3-5或2-6族半导体(例如GaN和ZnO)表面的极性来改善表面特性对电气和光学特性的重大影响的方法阴离子表面到更平滑和不活泼的阳离子表面。;解决方案:在蓝宝石上外延生长的3-5组或2-6组半导体膜内部形成了厚度约为几层金属(如Al)的膜基质。半导体表面的极性在薄膜的上部和下部从负离子(阴离子)变为正离子(阳离子)。在外延生长薄膜和具有良好取向特性的多晶薄膜中形成正极性。版权所有:(C)2002,JPO

著录项

  • 公开/公告号JP4187422B2

    专利类型

  • 公开/公告日2008-11-26

    原文格式PDF

  • 申请/专利权人 吉川 明彦;

    申请/专利号JP20010071746

  • 发明设计人 吉川 明彦;伊藤 茂生;

    申请日2001-03-14

  • 分类号H01L21/205;C30B29/16;C30B29/38;H01L21/28;H01L33;

  • 国家 JP

  • 入库时间 2022-08-21 19:37:36

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