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Secondary electron emission ratio measurement equipment

机译:二次电子发射率测量设备

摘要

Being cheap, it offers the small-sized secondary electron emission ratio measurement equipment. The secondary electron emission ratio measurement equipment which relates to this invention provides the cylindrical electrode for the tubular electrode and that central frame which possess the open part in apex, and makes the charged particle formation source and the charged particle beam focus in order to form the charged particle with the glow discharge plasma decompressing inside the secondary electronic test section and the vacuum chamber which have the small-sized secondary electronic measurement unit which consists of the secondary electronic collector section in order to capture the secondary electron which is discharged from the electrostatic lens and the suffering measurement substance in order to irradiate to suffering measurement ones and the sample retention section which keeps suffering measurement ones inside the vacuum chamberThe vapor supply section and the charged particle formation source which supply the gas which in the vapor exhaust section and the charged particle formation source which are done becomes the charged particle, it impresses voltage in the electrostatic lens, and the secondary electronic collector electrode the voltage impression section and the amperometry section which measure electric current and, it controls these, the control computer which calculates secondary electron emission ratio, the empty it is constituted.
机译:价格便宜,它提供了小型二次电子发射率测量设备。本发明涉及的二次电子发射率测定装置,其特征在于,提供管状电极用的圆筒状电极和在顶端具有开口部的中央框架,使带电粒子形成源和带电粒子束聚焦而形成。辉光放电等离子体在二次电子测试部和真空室内减压的带电粒子,其具有由二次电子收集器部构成的小型二次电子测量单元,以捕获从静电透镜释放的二次电子并且,为了向被测定物照射而产生的被测定物质以及在真空室内保持被测定物的试样保持部在蒸气排出部和带电粒子中供给气体的蒸气供给部和带电粒子形成源。所形成的形成源成为带电粒子,在静电透镜上施加电压,并向二次电子集电极电极施加测量电流的电压施加部和电流分析部,并对其进行控制,从而计算出二次电子。发射率,它是空的。

著录项

  • 公开/公告号JPWO2007049357A1

    专利类型

  • 公开/公告日2009-04-30

    原文格式PDF

  • 申请/专利权人 国立大学法人京都大学;

    申请/专利号JP20070542547

  • 发明设计人 森本 康彦;井手 亜里;

    申请日2005-10-28

  • 分类号G01N23/225;

  • 国家 JP

  • 入库时间 2022-08-21 19:37:23

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