首页> 外国专利> PLASMA CVD METHOD, METHOD FOR FORMING SILICON NITRIDE FILM, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND PLASMA CVD METHOD

PLASMA CVD METHOD, METHOD FOR FORMING SILICON NITRIDE FILM, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND PLASMA CVD METHOD

机译:等离子体CVD法,氮化硅膜的形成方法,半导体装置的制造方法以及等离子体CVD法

摘要

A plasma processing apparatus includes a process chamber configured to be vacuum-exhausted; a worktable configured to place a target substrate thereon inside the process chamber; a microwave generation source configured to generate microwaves; a planar antenna including a plurality of slots and configured to supply microwaves generated by the microwave generation source through the slots into the process chamber; a gas supply mechanism configured to supply a film formation source gas into the process chamber; and an RF power supply configured to apply an RF power to the worktable. The apparatus is preset to turn a nitrogen-containing gas and a silicon-containing gas supplied in the process chamber into plasma by the microwaves, and to deposit a silicon nitride film on a surface of the target substrate by use of the plasma, while applying the RF power to the worktable.
机译:等离子体处理装置包括:处理室,其被配置为真空排气;工作台,其配置为将目标基板放置在处理室内。微波产生源,被配置为产生微波;平面天线,其包括多个缝隙,并且被配置为将由微波产生源产生的微波通过缝隙供应到处理室中;气体供应机构,其将成膜源气体供应到处理室中;射频电源,被配置为向工作台施加射频功率。所述设备被预设为通过微波将在处理室中供应的含氮气体和含硅气体转变成等离子体,并且利用等离子体将氮化硅膜沉积在目标基板的表面上,同时施加工作台的射频功率。

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