首页> 外国专利> PHASE MEASUREMENT APPARATUS, SKEW MEASUREMENT APPARATUS, PHASE MEASUREMENT METHOD, AND SKEW MEASUREMENT METHOD

PHASE MEASUREMENT APPARATUS, SKEW MEASUREMENT APPARATUS, PHASE MEASUREMENT METHOD, AND SKEW MEASUREMENT METHOD

机译:相位测量装置,偏斜测量装置,相位测量方法和偏斜测量方法

摘要

There is provided a phase measurement apparatus for measuring a phase of a signal under measurement. The phase measurement apparatus includes a sampling section that samples the signal under measurement at timings indicated by a sampling clock supplied thereto, a jitter injecting section that injects jitter to at least one of the signal under measurement which is to be input into the sampling section and the sampling clock, and a phase calculating section that calculates the phase of the signal under measurement based on a result of the sampling performed by the sampling section.
机译:提供了一种用于测量被测信号的相位的相位测量设备。相位测量装置包括:采样部分,其在由提供给其的采样时钟指示的定时处对被测量信号进行采样;抖动注入部分,其向要输入到采样部分中的至少一个被测量信号注入抖动;以及相位计算部分,其基于采样部分执行的采样结果来计算被测信号的相位。

著录项

  • 公开/公告号US2008303509A1

    专利类型

  • 公开/公告日2008-12-11

    原文格式PDF

  • 申请/专利权人 MASAHIRO ISHIDA;

    申请/专利号US20070758676

  • 发明设计人 MASAHIRO ISHIDA;

    申请日2007-06-06

  • 分类号G01R25/00;

  • 国家 US

  • 入库时间 2022-08-21 19:35:34

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