首页> 外国专利> SKEW MEASUREMENT APPARATUS, SKEW MEASUREMENT METHOD, RECORDING MEDIA AND TEST APPARATUS

SKEW MEASUREMENT APPARATUS, SKEW MEASUREMENT METHOD, RECORDING MEDIA AND TEST APPARATUS

机译:偏斜测量装置,偏斜测量方法,记录介质和测试装置

摘要

Provided is a skew measurement apparatus, including sampling sections that each sample one of a plurality of signals under measurement having a cycle T, a waveform reconfiguring section that shapes a reconfigured waveform having the cycle T by rearranging ordinal ranks of sample values of the signal under measurement sampled by each sampling section, a distribution generating section that generates a timing distribution of edges in the reconfigured waveform of the corresponding signal under measurement, and a skew calculating section that calculates skew between the signals under measurement being compared based on the timing distribution of each signal under measurement.
机译:本发明提供一种歪斜测量装置,其包括:采样部分,每个采样部分对被测量的多个信号中的一个具有周期T,进行采样;波形重构部分,其通过重新排列该信号的采样值的有序等级来对具有周期T的重构波形进行整形。由每个采样部分采样的测量值,一个分布生成部分,它在相应的被测量信号的重构波形中生成边沿的时序分布,以及一个偏斜计算部分,该偏斜计算部分根据被测信号的时序分布计算被比较信号之间的偏斜每个被测信号。

著录项

  • 公开/公告号US2009281752A1

    专利类型

  • 公开/公告日2009-11-12

    原文格式PDF

  • 申请/专利权人 MASAHIRO ISHIDA;

    申请/专利号US20080116971

  • 发明设计人 MASAHIRO ISHIDA;

    申请日2008-05-08

  • 分类号G01R13/00;

  • 国家 US

  • 入库时间 2022-08-21 18:53:07

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