首页> 外国专利> Device Management Method, Analysis System Used for the Device Management Method, Data Structure Used in Management Database, and Maintenance Inspection Support Apparatus Used for the Device Management Method

Device Management Method, Analysis System Used for the Device Management Method, Data Structure Used in Management Database, and Maintenance Inspection Support Apparatus Used for the Device Management Method

机译:设备管理方法,用于设备管理方法的分析系统,用于管理数据库的数据结构以及用于设备管理方法的维护检查支持设备

摘要

Either a complete overhaul for replacing with recommended devices the entire number of devices in a large group of managed devices T, or a partial overhaul for repairing or replacing with recommended devices only those managed devices T that are malfunctioning is selectively performed as an initial overhaul. A complete test involving the entire number of the managed devices T is then periodically performed to determine whether the devices are operating normally or have a malfunction. Any devices found to be malfunctioning during any complete test are repaired or replaced with recommended devices.
机译:进行大修以用推荐的设备替换大群被管理设备T中的全部设备,或者进行部分大修以修理或用推荐的设备替换,只有有故障的那些被管理的设备T被选择性地执行为初始大修。然后,定期执行涉及被管理设备T总数的完整测试,以确定设备是否正常运行或存在故障。如果发现在任何完整测试期间出现故障的任何设备,则将其修理或更换为推荐的设备。

著录项

  • 公开/公告号US2009044042A1

    专利类型

  • 公开/公告日2009-02-12

    原文格式PDF

  • 申请/专利权人 YOSHIYASU FUJIWARA;KAZUNORI ODA;

    申请/专利号US20060996549

  • 发明设计人 YOSHIYASU FUJIWARA;KAZUNORI ODA;

    申请日2006-07-25

  • 分类号G06F11/20;G06F17/30;

  • 国家 US

  • 入库时间 2022-08-21 19:34:36

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