首页> 外国专利> Device management method, analysis system used for the device management method, data structure used in management database, and maintenance inspection support apparatus used for the device management method

Device management method, analysis system used for the device management method, data structure used in management database, and maintenance inspection support apparatus used for the device management method

机译:设备管理方法,用于设备管理方法的分析系统,在管理数据库中使用的数据结构以及用于设备管理方法的维护检查支持设备

摘要

Either a complete overhaul for replacing with recommended devices the entire number of devices in a large group of managed devices T, or a partial overhaul for repairing or replacing with recommended devices only those managed devices T that are malfunctioning is selectively performed as an initial overhaul. A complete test involving the entire number of the managed devices T is then periodically performed to determine whether the devices are operating normally or have a malfunction. Any devices found to be malfunctioning during any complete test are repaired or replaced with recommended devices.
机译:进行大修以用推荐的设备替换大群被管理设备T中的全部设备,或者进行部分大修以用推荐的设备进行修理或替换,只有发生故障的那些被管理设备T才有选择地作为初始大修。然后,定期执行涉及被管理设备T总数的完整测试,以确定设备是否正常运行或存在故障。在任何完整测试期间发现任何故障的设备都将被修理或更换为推荐的设备。

著录项

  • 公开/公告号US8762105B2

    专利类型

  • 公开/公告日2014-06-24

    原文格式PDF

  • 申请/专利权人 YOSHIYASU FUJIWARA;KAZUNORI ODA;

    申请/专利号US20060996549

  • 发明设计人 YOSHIYASU FUJIWARA;KAZUNORI ODA;

    申请日2006-07-25

  • 分类号F16T1/48;G06Q10;

  • 国家 US

  • 入库时间 2022-08-21 16:02:56

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