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Method and apparatus for multiple scan rate swept wavelength laser-based optical sensor interrogation system with optical path length measurement capability
Method and apparatus for multiple scan rate swept wavelength laser-based optical sensor interrogation system with optical path length measurement capability
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机译:具有光程长度测量能力的基于多扫描速率扫频激光的光学传感器询问系统的方法和装置
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摘要
The invention relates to optical sensor measurement methods that use a swept wavelength optical source to determine wavelength shift as well as to optical sensor systems that embody and employ these methods. A variable scan rate swept optical source is used to determine the optical path length from the optical interrogator to the optical sensors being measured. This data can then be used as desired or needed in implementing the sensor or making sensor measurements. In particular the data can be used in the optical sensor system to compensate for potential measurement errors due to the finite speed of light in the optical medium interconnecting optical sensors under test.
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