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Method for determining the absolute thickness of non-transparent and transparent samples by means of confocal measurement technology
Method for determining the absolute thickness of non-transparent and transparent samples by means of confocal measurement technology
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机译:共焦测量技术确定不透明和透明样品的绝对厚度的方法
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摘要
The invention relates to a method for determining the absolute spatially resolved double-sided topography and thickness of specimens using two opposite confocally working microscopes. After the unit has been calibrated, the topography of the specimen is measured on both sides of the specimen, is added and the calibration plane is subtracted. The invention also relates to a device for carrying out the method.
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